ASTM E 1829 Standard Guide for Handling Specimens Prior to Surface Analysis

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ASTM E 1829 Document Information:

Title
Standard Guide for Handling Specimens Prior to Surface Analysis

ASTM International

Publication Date:
Apr 10, 2002

Scope:

This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

Auger electron spectroscopy (AES),

X-ray photoelectron spectroscopy (XPS or ESCA), and

Secondary ion mass spectrometry, SIMS.

Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectros-copy, where specimen handling can influence surface-sensitive measurements.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords:

Auger electron spectroscopy
secondary ion mass spectrometry
specimen handling
surface analysis
X-ray photoelectron spectroscopy

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