ASTM F 1404 Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique
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ASTM F 1404 Document Information:
Title
Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique
ASTM International
Publication Date:
May 15, 1992
Scope:
This test method is used to determine whether an ingot or wafer
of gallium arsenide is monocrystalline and, if so, to measure the
etch pit density and to judge the nature of crystal imperfections.
To the extent possible, it follows the corresponding test method
for silicon, Test Method F 47. Test Method F 47 also presents the
definition of many crystallographic terms, applicable to this test
method.
This procedure is suitable for gallium arsenide crystals with
etch pit densities between 0 and 200 000/cm2.
Gallium arsenide, either doped or undoped, and with various
electrical properties, may be evaluated by this test method. The
front surface normal direction of the sample must be parallel to
the <001> within ± 5° and must be suitably prepared by
polishing or etching, or both. Unremoved processing damage may lead
to etch pits, obscuring the quality of the bulk crystal.
This standard does not purport to address all of the safety
problems, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and
health practices and to determine the applicability of regulatory
limitations prior to use. Specific hazard statements are given in
Section 8.
Keywords:
- crystal perfection
- etch pit density
- gallium arsenide
- potassium hydroxide etch
- semiconductor
- single crystal
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