ASTM F 676 Standard Test Method for Measuring Unsaturated TTL Sink Current

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ASTM F 676 Document Information:

Title
Standard Test Method for Measuring Unsaturated TTL Sink Current

ASTM International

Publication Date:
Dec 10, 1997

Scope:

This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.

Units - The values stated in the International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords:

hardness assurance

neutron degradation

sink current

transistor-transistor logic (TTL)

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