IEEE 592: Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
SDO: IEEE: The Institute of Electrical and Electronics Engineers, Inc.
DOD Adopted ANSI Approved Approved
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
- fault-current initiation
- shield resistance
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